Electronics Failure Analysis

Electronics Failure Analysis: Failure Analysis (FA) testing on electronics is a common technique that utilizes a FLIR thermal camera to visualize and identify anomalies on small Integrated Circuits and PCB’s down to 3.5um spot sizes. This non contact, high resolution testing at a few micron spot sizes allows you to reduce testing times and improve designs during the product development cycle.

Electronics Failure Analysis Video Gallery


Electronics Failure Analysis Image Gallery

FLIR Partners


FLIR Infrared Cameras for Electronics Failure Analysis Applications

Entry Level Products

FLIR A655sc IR Camera

FLIR A655sc IR Camera

An Uncooled detector, high resolution, and all of the cutting-edge functionality the A655sc brings affordable research and science thermal imaging and measurement to a whole new level.



Performance Level Products

FLIR A6700sc LWIR and MWIR Cameras

FLIR A6750sc Cameras

Designed for electronics inspections, medical thermography, manufacturing monitoring, and non-destructive testing, the camera is ideal for high-speed thermal events and fast-moving targets.



Advanced Level Products

FLIR SC8000 HD Series IR Camera

FLIR SC8000 HD Series IR Cameras

High definition MWIR imagery from a highly sensitive cooled InSb detector, the sc8000 Series provides superb resolution, and lightning fast frame and data rates for extreme imaging flexibility and data capture capability.